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Title: Recent Advances in Topography Research
Edited by: Jan Buytaert
ISBN10-13: 1626188408 : 9781626188402
Format: Hardback
Size: 260x180mm
Pages: 384
Weight: .946 Kg.
Published: Nova Science Publishers, Inc (US) - July   2013
List Price: 212.99 Pounds Sterling
Availability: Temporarily Out of Stock, more expected soon 
Subjects: Earth sciences
The book at hand covers many of the different classes of topography/profilometry, and will give the reader an overview of different aspects of current profilometric methods. The intent is to show the possibilities, the state-of-the-art and some recent advances in the field by bringing together a non-exhaustive but diverse selection of profilometric methods. Some methods are fresh and unique like the one pixel profilometer or the sampling moiré method. Others are more consolidated, like Fourier transform profilometry but now in real-time, and even commercially available, like the newest time-of-flight cameras for 3D vision. The techniques in this book range from projection moiré to binary dithering pattern projection to areal surface mapping. They include an endoscopic implementation to an omnidirectional vision system and techniques using Fourier analysis to time-of-flight principles. Also, techniques applicable in biomedicine to engineering applications. Even from atomic force microscopy to optical coherence tomography, which both used as topographical means. Finally, some in-depth specialist reviews are included of new profilometric methods or new commercial profilometric devices. The book contains 12 chapters from selected authors from all over the world considered authorities in their field. The individual chapters are written to give a thorough introduction to each respective topographic method, and include a lot of background and abundant references, so that the book serves as a good introduction or reference.
Table of Contents:
Preface; Calibration & Adjustment of Areal Surface Topography Measuring Instruments; Superfast 3D Shape Measurement with Binary Dithering Techniques; High-Resolution Temporal Profilometry Using Fourier Estimation; Single-Shot Phase Analysis by the Sampling Moiré Method & its Application to Displacement Measurement; Validation of an Experimental Low-Cost Projection Moiré Profilometer for 3D Surface Imaging of Anatomical Models of the Middle Third of the Face; High-Speed Fourier Transform Profilometry for Reconstructing Objects Having Arbitrary Surface Colours; Large-Volume Optical Coherence Tomography with Real-Time Correction of Geometric Distortion Artifacts; Morphological Characterization Of Biomaterials Using Atomic Force Microscopy; A Device for Endoscopic Measurements of Forming Tools with Filigree Side Elements; Omnidirectional Vision System with Conic Mirror for On-Line Quality Measurements on Quasi-Cylindrical Cavities; A Review on Commercial Solid State 3D Cameras for Machine Vision Applications; Time of Flight Cameras (3D Vision); Index.
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